Residual stress analysis in micro- and nano-structured materialsby X-ray diffraction
Journal Article
·
· International Journal of Materials and ProductTechnology
OSTI ID:900658
No abstract prepared.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Director. Office of Science. Office of AdvancedScientific Computing Research. Office of Basic EnergySciences
- DOE Contract Number:
- DE-AC02-05CH11231
- OSTI ID:
- 900658
- Report Number(s):
- LBNL-60913; R&D Project: A580ES; BnR: KC0204016; TRN: US200711%%221
- Journal Information:
- International Journal of Materials and ProductTechnology, Vol. 26, Issue 3-4; Related Information: Journal Publication Date: 2006
- Country of Publication:
- United States
- Language:
- English
Similar Records
Measurement of Residual Stress Distributions by Energy Dispersive X-ray Diffraction Synchrotron Radiation
From cells to laminate: probing and modeling residual stress evolution in thin silicon photovoltaic modules using synchrotron X-ray micro-diffraction experiments and finite element simulations
FOURIER ANALYSIS OF X-RAY MICRO-DIFFRACTION PROFILES TO CHARACTERIZE LASER SHOCK PEENED METALS
Journal Article
·
Sun Jan 01 00:00:00 EST 2006
· Int. J. Offshore Polar Eng.
·
OSTI ID:900658
+2 more
From cells to laminate: probing and modeling residual stress evolution in thin silicon photovoltaic modules using synchrotron X-ray micro-diffraction experiments and finite element simulations
Journal Article
·
Wed Apr 12 00:00:00 EDT 2017
· Progress in Photovoltaics
·
OSTI ID:900658
+6 more
FOURIER ANALYSIS OF X-RAY MICRO-DIFFRACTION PROFILES TO CHARACTERIZE LASER SHOCK PEENED METALS
Journal Article
·
Sat Jan 01 00:00:00 EST 2005
· Journal of Environmental Monitoring
·
OSTI ID:900658
+2 more