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An X-ray Absorption Edge Detector for High-Resolution Measurement of Undulator Effective K-Parameter

Conference · · AIP Conf.Proc.868:549-557,2006
OSTI ID:900613
The spectrum of angle-integrated undulator radiation displays a sharp edge at every harmonic photon energy. A technique utilizing this feature to measure minute changes in K-parameters of an undulator in a free-electron laser has been proposed. To date, this technique requires the use of crystal monochromators as bandpass filters whose energy centroid depends on the incident angle of the x-ray beam. In this work we propose to use the absorption edge of an appropriate element as an energy-selective detector whose response is truly independent of the angle of the x-ray beam, and hence independent of electron beam direction and emittance. We will discuss the basic design concept of the detection system and illustrate its projected performance with computer simulations.
Research Organization:
Stanford Linear Accelerator Center (SLAC)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC02-76SF00515;
OSTI ID:
900613
Report Number(s):
SLAC-PUB-12352
Conference Information:
Journal Name: AIP Conf.Proc.868:549-557,2006
Country of Publication:
United States
Language:
English