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Title: Radiation experience with the CDF silicon detectors

Abstract

The silicon detectors of the CDF experiment at the Tevatron collider are operated in a harsh radiation environment. The lifetime of the silicon detectors is limited by radiation damage, and beam-related incidents are an additional risk. This article describes the impact of beam-related incidents on detector operation and the effects of radiation damage on electronics noise and the silicon sensors. From measurements of the depletion voltage as a function of the integrated luminosity, estimates of the silicon detector lifetime are derived.

Authors:
;
Publication Date:
Research Org.:
Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
892261
Report Number(s):
FERMILAB-CONF-05-606-E
TRN: US0701364
DOE Contract Number:  
AC02-76CH03000
Resource Type:
Conference
Resource Relation:
Journal Name: Nucl.Instrum.Meth.A569:65-68,2006; Conference: Presented at VERTEX 2005, Chuzenji Lake, Nikko, Japan, 7-11 Nov 2005
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; FERMILAB COLLIDER DETECTOR; FERMILAB TEVATRON; LIFETIME; LUMINOSITY; RADIATIONS; SILICON; Instrumentation

Citation Formats

Husemann, Ulrich, and /Rochester U. Radiation experience with the CDF silicon detectors. United States: N. p., 2005. Web.
Husemann, Ulrich, & /Rochester U. Radiation experience with the CDF silicon detectors. United States.
Husemann, Ulrich, and /Rochester U. Tue . "Radiation experience with the CDF silicon detectors". United States. doi:. https://www.osti.gov/servlets/purl/892261.
@article{osti_892261,
title = {Radiation experience with the CDF silicon detectors},
author = {Husemann, Ulrich and /Rochester U.},
abstractNote = {The silicon detectors of the CDF experiment at the Tevatron collider are operated in a harsh radiation environment. The lifetime of the silicon detectors is limited by radiation damage, and beam-related incidents are an additional risk. This article describes the impact of beam-related incidents on detector operation and the effects of radiation damage on electronics noise and the silicon sensors. From measurements of the depletion voltage as a function of the integrated luminosity, estimates of the silicon detector lifetime are derived.},
doi = {},
journal = {Nucl.Instrum.Meth.A569:65-68,2006},
number = ,
volume = ,
place = {United States},
year = {Tue Nov 01 00:00:00 EST 2005},
month = {Tue Nov 01 00:00:00 EST 2005}
}

Conference:
Other availability
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