Bunch Pattern With More Bunches in PEP-II
The number of bunches in the PEP-II B-Factory has increased over the years. The luminosity has followed roughly linearly that increase or even faster since we have also lowered the spot size at the interaction point. The recent steps from 939 bunches in June of 2003 to about 1320 in February 2004 (and 1585 in May) should have been followed by a similar rise in luminosity from 6.5 {center_dot} 10{sup 33} l/cm{sup 2} {center_dot} 1/s to 9.1 {center_dot} 10{sup 33} 1/cm{sup 2} {center_dot} 1/s (or even 11 {center_dot} 10{sup 33} 1/cm{sup 2} {center_dot} 1/s in May). This didn't happen so far and a peak luminosity of ''only'' 7.3 {center_dot} 10{sup 33} 1/cm{sup 2} {center_dot} 1/s (or 9.2 {center_dot} 10{sup 33} 1/cm{sup 2} {center_dot} 1/s in May) was achieved with less bunch currents. By filling the then partially filled by-3 pattern to a completely filled by-3 pattern (1133 bunches) we should get 7.9 {center_dot} 10{sup 33} 1/cm{sup 2} {center_dot} 1/s with scaled currents of 1400 mA (HER) on 1900 mA (LER). We were typically running about 1300 mA on 1900 mA with 15% more bunches in February (and 1550 mA on 2450 mA with 40% more bunches in May). The bunch pattern is typically by-2 with trains of 14 bunches out of 18 (or 67 out of 72). The parasitic beam crossings or electron cloud effects might play a role at about a 5-10% luminosity loss. Also the LER x-tune could be pushed further down to the 1/2 integer in the by-3 pattern. On the other hand, we might not push the beam-beam tune shift as hard as in June of 2003 since we have started trickle injection and therefore might avoid the highest peak luminosity which probably has a higher background.
- Research Organization:
- SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC02-76SF00515
- OSTI ID:
- 890845
- Report Number(s):
- SLAC-PUB-11163; TRN: US0604840
- Resource Relation:
- Conference: Presented at the 9th European Particle Accelerator Conference (EPAC 2004), Lucerne, Switzerland, 5-9 Jul 2004
- Country of Publication:
- United States
- Language:
- English
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