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Title: Strand bias of UV-induced mutation at the adenine phosphoribosyltransferase locus in DNA repair-proficient versus-deficient CHO cells

Journal Article · · Environmental and Molecular Mutagenesis
OSTI ID:88916
; ; ; ;  [1]
  1. Univ. of Texas M.D. Anderson Cancer Center, Smithville, TX (United States)

Preferential repair of UV-induced photoproducts on the transcribed strand of actively transcribed genes should lead to a marked strand bias for UV-induced mutations. Most mammalian mutation studies to date have focused on a single gene locus (HPRT). We have been examining UV-induced photoproduct formation and repair at the CHO APRT locus. To determine whether UV-induced mutations at the APRT locus show a strand bias reflective of preferential repair of UV-photoproducts, we have examined the strand specificity of UV-induced APRT gene mutations in repair-proficient versus-deficient (ERCC1 mutant) cells. The majority of UV-induced mutations at the CHO APRT locus involve C{r_arrow}T transitions at dipyrimidine sites, with some transversions and tandem double mutations. Some strand bias for mutation was observed in repair-proficient cells; approximately twice as many UV-induced APRT gene mutations arose at dipyrimidine sites on the non-transcribed strand than on the transcribed strand. In repair-deficient cells, slightly more mutations occurred at dipyrimidine site on the transcribed strand. These results are consistent with preferential repair of UV-induced photoproducts on the transcribed strand, but the strand bias of mutation observed at the CHO APRT locus was much smaller than that which has been reported for the HPRT locus.

OSTI ID:
88916
Report Number(s):
CONF-9405324-; ISSN 0893-6692; CNN: Grant CA-04484, Grant ES-03124; TRN: 95:017979
Journal Information:
Environmental and Molecular Mutagenesis, Vol. 23, Issue Suppl.23; Conference: 25. annual meeting of the Environmental Mutagen Society, Portland, OR (United States), 7-12 May 1994; Other Information: PBD: 1994
Country of Publication:
United States
Language:
English