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Title: Analytical Microscopy

Technical Report ·
DOI:https://doi.org/10.2172/887349· OSTI ID:887349

In the Analytical Microscopy group, within the National Center for Photovoltaic's Measurements and Characterization Division, we combine two complementary areas of analytical microscopy--electron microscopy and proximal-probe techniques--and use a variety of state-of-the-art imaging and analytical tools. We also design and build custom instrumentation and develop novel techniques that provide unique capabilities for studying materials and devices. In our work, we collaborate with you to solve materials- and device-related R&D problems. This sheet summarizes the uses and features of four major tools: transmission electron microscopy, scanning electron microscopy, the dual-beam focused-ion-beam workstation, and scanning probe microscopy.

Research Organization:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC36-99-GO10337
OSTI ID:
887349
Report Number(s):
NREL/BR-520-40120; TRN: US200618%%87
Resource Relation:
Related Information: National Renewable Energy Laboratory (NREL) Measurements & Characterization (Brochure)
Country of Publication:
United States
Language:
English