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Electrical Charge Trapping at Defects on the Si(111)7x7 Surface

Journal Article · · Applied Physics Letters
OSTI ID:885191
; ; ; ;
No abstract prepared.
Research Organization:
National Renewable Energy Laboratory (NREL), Golden, CO.
Sponsoring Organization:
USDOE
DOE Contract Number:
AC36-99GO10337
OSTI ID:
885191
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 62006; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English

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Related Subjects

36 MATERIALS SCIENCE
CRYSTAL DEFECTS
DEFECTS
DISORDERED DOMAINS
ELECTRIC CHARGES
ELECTRON TRAPPING
KELVIN PROBE FORCE MICROSCOPY (KPFM)
SCANNING TUNNELING MICROSCOPY (STM)
SILICON
Solar Energy - Photovoltaics
TRAPPING