IN SITU GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING REAL TIME MONITORING OF THE ROLE OF HUMIDITY DURING THE STRUCTURAL FORMATION OF TEMPLATED SILICA THIN FILMS
Journal Article
·
· REV. SCI. INSTRUM.
OSTI ID:884176
No abstract prepared.
- Research Organization:
- Brookhaven National Laboratory (BNL) National Synchrotron Light Source (NSLS)
- Sponsoring Organization:
- DOE/OFFICE OF SCIENCE
- DOE Contract Number:
- AC02-98CH10886
- OSTI ID:
- 884176
- Report Number(s):
- BNL--76189-2005-JA
- Journal Information:
- REV. SCI. INSTRUM., Journal Name: REV. SCI. INSTRUM. Journal Issue: 6 Vol. 76; ISSN 0034-6748; ISSN RSINAK
- Country of Publication:
- United States
- Language:
- English
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