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IN SITU GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING REAL TIME MONITORING OF THE ROLE OF HUMIDITY DURING THE STRUCTURAL FORMATION OF TEMPLATED SILICA THIN FILMS

Journal Article · · REV. SCI. INSTRUM.
OSTI ID:884176
No abstract prepared.
Research Organization:
Brookhaven National Laboratory (BNL) National Synchrotron Light Source (NSLS)
Sponsoring Organization:
DOE/OFFICE OF SCIENCE
DOE Contract Number:
AC02-98CH10886
OSTI ID:
884176
Report Number(s):
BNL--76189-2005-JA
Journal Information:
REV. SCI. INSTRUM., Journal Name: REV. SCI. INSTRUM. Journal Issue: 6 Vol. 76; ISSN 0034-6748; ISSN RSINAK
Country of Publication:
United States
Language:
English

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