Condition assessment of nonlinear processes

Patent · Tue Jan 01 00:00:00 EST 2002

OSTI ID:874888

Hively, Lee M ^[1]; Gailey, Paul C ^[2]; Protopopescu, Vladimir A ^[3]

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1. Philadelphia, TN
2. Athens, OH
3. Knoxville, TN

There is presented a reliable technique for measuring condition change in nonlinear data such as brain waves. The nonlinear data is filtered and discretized into windowed data sets. The system dynamics within each data set is represented by a sequence of connected phase-space points, and for each data set a distribution function is derived. New metrics are introduced that evaluate the distance between distribution functions. The metrics are properly renormalized to provide robust and sensitive relative measures of condition change. As an example, these measures can be used on EEG data, to provide timely discrimination between normal, preseizure, seizure, and post-seizure states in epileptic patients. Apparatus utilizing hardware or software to perform the method and provide an indicative output is also disclosed.

• Research Organization: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
• DOE Contract Number: AC05-96OR22464
• Assignee: Lockheed Martin Energy Research Corporation (Oak Ridge, TN)
• Patent Number(s): US 6484132
• OSTI ID: 874888
• Country of Publication: United States
• Language: English

Related Subjects

condition
assessment
nonlinear
processes
reliable
technique
measuring
change
data
brain
waves
filtered
discretized
windowed
sets
dynamics
set
represented
sequence
connected
phase-space
distribution
function
derived
metrics
introduced
evaluate
distance
functions
properly
renormalized
provide
robust
sensitive
measures
example
eeg
timely
discrimination
normal
preseizure
seizure
post-seizure
epileptic
patients
apparatus
utilizing
hardware
software
perform
method
indicative
output
disclosed
data set
brain wave
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