Linear and angular retroreflecting interferometric alignment target

Patent · Mon Jan 01 00:00:00 EST 2001

OSTI ID:874152

Maxey, L Curtis ^[1]

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1. Powell, TN

The present invention provides a method and apparatus for measuring both the linear displacement and angular displacement of an object using a linear interferometer system and an optical target comprising a lens, a reflective surface and a retroreflector. The lens, reflecting surface and retroreflector are specifically aligned and fixed in optical connection with one another, creating a single optical target which moves as a unit that provides multi-axis displacement information for the object with which it is associated. This displacement information is useful in many applications including machine tool control systems and laser tracker systems, among others.

• Research Organization: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
• DOE Contract Number: AC05-96OR22464
• Assignee: UT-Battelle, LLC (Oak Ridge, TN)
• Patent Number(s): US 6327038
• OSTI ID: 874152
• Country of Publication: United States
• Language: English

Related Subjects

linear
angular
retroreflecting
interferometric
alignment
target
provides
method
apparatus
measuring
displacement
interferometer
optical
comprising
lens
reflective
surface
retroreflector
reflecting
specifically
aligned
fixed
connection
creating
single
moves
unit
multi-axis
information
associated
useful
applications
including
machine
tool
control
systems
laser
tracker
reflecting surface
single optical
angular displacement
linear displacement
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