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Title: X-ray radiography with highly charged ions

Patent ·
OSTI ID:873227

An extremely small (1-250 micron FWHM) beam of slow highly charged ions deexciting on an x-ray production target generates x-ray monochromatic radiation that is passed through a specimen and detected for imaging. The resolution of the x-ray radiograms is improved and such detection is achieved with relatively low dosages of radiation passing through the specimen. An apparatus containing an electron beam ion trap (and modifications thereof) equipped with a focusing column serves as a source of ions that generate radiation projected onto an image detector. Electronic and other detectors are able to detect an increased amount of radiation per pixel than achieved by previous methods and apparati.

Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
DOE Contract Number:
W-7405-ENG-48
Assignee:
Regents of University of California (Oakland, CA)
Patent Number(s):
US 6115452
OSTI ID:
873227
Country of Publication:
United States
Language:
English

References (4)

The Electron‐Beam Ion Trap journal October 1994
X-ray microscopy journal January 1996
Projection x-ray microscope powered by highly charged ions journal January 1998
Quantitative mapping of species moving in solution by x-ray projection microscopy journal April 1997