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Title: Method and apparatus for calibrating a particle emissions monitor

Abstract

The instant invention discloses method and apparatus for calibrating particulate emissions monitors, in particular, and sampling probes, in general, without removing the instrument from the system being monitored. A source of one or more specific metals in aerosol (either solid or liquid) or vapor form is housed in the instrument. The calibration operation is initiated by moving a focusing lens, used to focus a light beam onto an analysis location and collect the output light response, from an operating position to a calibration position such that the focal point of the focusing lens is now within a calibration stream issuing from a calibration source. The output light response from the calibration stream can be compared to that derived from an analysis location in the operating position to more accurately monitor emissions within the emissions flow stream.

Inventors:
 [1];  [2]
  1. (Livermore, CA)
  2. (Tracy, CA)
Publication Date:
Research Org.:
SANDIA CORP
OSTI Identifier:
871694
Patent Number(s):
US 5777734
Application Number:
08/585,341
Assignee:
Sandia Corporation (Livermore, CA) SNL
DOE Contract Number:
AC04-94AL85000
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; apparatus; calibrating; particle; emissions; monitor; instant; discloses; particulate; monitors; particular; sampling; probes; removing; instrument; monitored; source; specific; metals; aerosol; solid; liquid; vapor; form; housed; calibration; operation; initiated; moving; focusing; lens; focus; light; beam; analysis; location; collect; output; response; operating; position; focal; stream; issuing; compared; derived; accurately; flow; output light; particulate emissions; focusing lens; light beam; flow stream; sampling probe; operating position; vapor form; analysis location; particle emissions; particulate emission; specific metal; /356/

Citation Formats

Flower, William L., and Renzi, Ronald F. Method and apparatus for calibrating a particle emissions monitor. United States: N. p., 1998. Web.
Flower, William L., & Renzi, Ronald F. Method and apparatus for calibrating a particle emissions monitor. United States.
Flower, William L., and Renzi, Ronald F. Tue . "Method and apparatus for calibrating a particle emissions monitor". United States. doi:. https://www.osti.gov/servlets/purl/871694.
@article{osti_871694,
title = {Method and apparatus for calibrating a particle emissions monitor},
author = {Flower, William L. and Renzi, Ronald F.},
abstractNote = {The instant invention discloses method and apparatus for calibrating particulate emissions monitors, in particular, and sampling probes, in general, without removing the instrument from the system being monitored. A source of one or more specific metals in aerosol (either solid or liquid) or vapor form is housed in the instrument. The calibration operation is initiated by moving a focusing lens, used to focus a light beam onto an analysis location and collect the output light response, from an operating position to a calibration position such that the focal point of the focusing lens is now within a calibration stream issuing from a calibration source. The output light response from the calibration stream can be compared to that derived from an analysis location in the operating position to more accurately monitor emissions within the emissions flow stream.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jul 07 00:00:00 EDT 1998},
month = {Tue Jul 07 00:00:00 EDT 1998}
}

Patent:

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