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Title: Method and apparatus for calibrating a particle emissions monitor

Abstract

The instant invention discloses method and apparatus for calibrating particulate emissions monitors, in particular, and sampling probes, in general, without removing the instrument from the system being monitored. A source of one or more specific metals in aerosol (either solid or liquid) or vapor form is housed in the instrument. The calibration operation is initiated by moving a focusing lens, used to focus a light beam onto an analysis location and collect the output light response, from an operating position to a calibration position such that the focal point of the focusing lens is now within a calibration stream issuing from a calibration source. The output light response from the calibration stream can be compared to that derived from an analysis location in the operating position to more accurately monitor emissions within the emissions flow stream.

Inventors:
 [1];  [2]
  1. (Livermore, CA)
  2. (Tracy, CA)
Publication Date:
Research Org.:
SANDIA CORP
OSTI Identifier:
871694
Patent Number(s):
US 5777734
Application Number:
08/585,341
Assignee:
Sandia Corporation (Livermore, CA) SNL
DOE Contract Number:
AC04-94AL85000
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; apparatus; calibrating; particle; emissions; monitor; instant; discloses; particulate; monitors; particular; sampling; probes; removing; instrument; monitored; source; specific; metals; aerosol; solid; liquid; vapor; form; housed; calibration; operation; initiated; moving; focusing; lens; focus; light; beam; analysis; location; collect; output; response; operating; position; focal; stream; issuing; compared; derived; accurately; flow; output light; particulate emissions; focusing lens; light beam; flow stream; sampling probe; operating position; vapor form; analysis location; particle emissions; particulate emission; specific metal; /356/

Citation Formats

Flower, William L., and Renzi, Ronald F. Method and apparatus for calibrating a particle emissions monitor. United States: N. p., 1998. Web.
Flower, William L., & Renzi, Ronald F. Method and apparatus for calibrating a particle emissions monitor. United States.
Flower, William L., and Renzi, Ronald F. 1998. "Method and apparatus for calibrating a particle emissions monitor". United States. doi:. https://www.osti.gov/servlets/purl/871694.
@article{osti_871694,
title = {Method and apparatus for calibrating a particle emissions monitor},
author = {Flower, William L. and Renzi, Ronald F.},
abstractNote = {The instant invention discloses method and apparatus for calibrating particulate emissions monitors, in particular, and sampling probes, in general, without removing the instrument from the system being monitored. A source of one or more specific metals in aerosol (either solid or liquid) or vapor form is housed in the instrument. The calibration operation is initiated by moving a focusing lens, used to focus a light beam onto an analysis location and collect the output light response, from an operating position to a calibration position such that the focal point of the focusing lens is now within a calibration stream issuing from a calibration source. The output light response from the calibration stream can be compared to that derived from an analysis location in the operating position to more accurately monitor emissions within the emissions flow stream.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = 1998,
month = 7
}

Patent:

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  • The invention discloses a method and apparatus for calibrating particulate emissions monitors, in particular, sampling probes, and in general, without removing the instrument from the system being monitored. A source of one or more specific metals in aerosol (either solid or liquid) or vapor form is housed in the instrument. The calibration operation is initiated by moving a focusing lens, used to focus a light beam onto an analysis location and collect the output light response, from an operating position to a calibration position such that the focal point of the focusing lens is now within a calibration stream issuingmore » from a calibration source. The output light response from the calibration stream can be compared to that derived from an analysis location in the operating position to more accurately monitor emissions within the emissions flow stream. 6 figs.« less
  • The present invention discloses a process for removing undesired particles from a gas stream including the steps of contacting a composition containing an adhesive with the gas stream; collecting the undesired particles and adhesive on a collection surface to form an aggregate comprising the adhesive and undesired particles on the collection surface; and removing the agglomerate from the collection zone. The composition may then be atomized and injected into the gas stream. The composition may include a liquid that vaporizes in the gas stream. After the liquid vaporizes, adhesive particles are entrained in the gas stream. The process may bemore » applied to electrostatic precipitators and filtration systems to improve undesired particle collection efficiency. 5 figs.« less
  • The present invention discloses a process for removing undesired particles from a gas stream including the steps of contacting a composition containing an adhesive with the gas stream; collecting the undesired particles and adhesive on a collection surface to form an aggregate comprising the adhesive and undesired particles on the collection surface; and removing the agglomerate from the collection zone. The composition may then be atomized and injected into the gas stream. The composition may include a liquid that vaporizes in the gas stream. After the liquid vaporizes, adhesive particles are entrained in the gas stream. The process may bemore » applied to electrostatic precipitators and filtration systems to improve undesired particle collection efficiency.« less
  • The disclosure relates to resistance only monitoring and calibration in an electrical cell analyzer. Sample and sheath fluid flows of different salinities are utilized, the sample flow being diameter modulated to produce a selected pattern which is compared to the resistance measured across the flows.
  • A calibration apparatus for calibrating a linear variable differential transformer (LVDT) having an armature positioned in au LVDT armature orifice, and the armature able to move along an axis of movement. The calibration apparatus includes a heating mechanism with an internal chamber, a temperature measuring mechanism for measuring the temperature of the LVDT, a fixture mechanism with an internal chamber for at least partially accepting the LVDT and for securing the LVDT within the heating mechanism internal chamber, a moving mechanism for moving the armature, a position measurement mechanism for measuring the position of the armature, and an output voltagemore » measurement mechanism. A method for calibrating an LVDT, including the steps of: powering the LVDT; heating the LVDT to a desired temperature; measuring the position of the armature with respect to the armature orifice; and measuring the output voltage of the LVDT.« less