Method and apparatus for calibrating a particle emissions monitor

Patent · Tue Jul 07 04:00:00 EDT 1998

OSTI ID:871694

Flower, William L ^[1]; Renzi, Ronald F ^[2]

---

1. Livermore, CA
2. Tracy, CA

The instant invention discloses method and apparatus for calibrating particulate emissions monitors, in particular, and sampling probes, in general, without removing the instrument from the system being monitored. A source of one or more specific metals in aerosol (either solid or liquid) or vapor form is housed in the instrument. The calibration operation is initiated by moving a focusing lens, used to focus a light beam onto an analysis location and collect the output light response, from an operating position to a calibration position such that the focal point of the focusing lens is now within a calibration stream issuing from a calibration source. The output light response from the calibration stream can be compared to that derived from an analysis location in the operating position to more accurately monitor emissions within the emissions flow stream.

• Research Organization: SANDIA CORP
• DOE Contract Number: AC04-94AL85000
• Assignee: Sandia Corporation (Livermore, CA)
• Patent Number(s): US 5777734
• Application Number: 08/585,341
• OSTI ID: 871694
• Country of Publication: United States
• Language: English

Related Subjects

/356/
accurately
aerosol
analysis
analysis location
apparatus
beam
calibrating
calibration
collect
compared
derived
discloses
emissions
flow
flow stream
focal
focus
focusing
focusing lens
form
housed
initiated
instant
instrument
issuing
lens
light
light beam
liquid
location
metals
method
monitor
monitored
monitors
moving
operating
operating position
operation
output
output light
particle
particle emissions
particular
particulate
particulate emission
particulate emissions
position
probes
removing
response
sampling
sampling probe
solid
source
specific
specific metal
stream
vapor
vapor form