Method for reduction of selected ion intensities in confined ion beams
Patent
·
OSTI ID:871633
- Richland, WA
A method for producing an ion beam having an increased proportion of analyte ions compared to carrier gas ions is disclosed. Specifically, the method has the step of addition of a charge transfer gas to the carrier analyte combination that accepts charge from the carrier gas ions yet minimally accepts charge from the analyte ions thereby selectively neutralizing the carrier gas ions. Also disclosed is the method as employed in various analytical instruments including an inductively coupled plasma mass spectrometer.
- Research Organization:
- Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
- DOE Contract Number:
- AC06-76RL01830
- Assignee:
- Battelle Memorial Institute (Richland, WA)
- Patent Number(s):
- US 5767512
- OSTI ID:
- 871633
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
method
reduction
selected
intensities
confined
beams
producing
beam
increased
proportion
analyte
compared
carrier
gas
disclosed
specifically
step
addition
charge
transfer
combination
accepts
minimally
selectively
neutralizing
employed
various
analytical
instruments
including
inductively
coupled
plasma
mass
spectrometer
analytical instruments
transfer gas
inductively coupled
mass spectrometer
carrier gas
coupled plasma
charge transfer
selectively neutralizing
analytical instrument
increased proportion
/250/
reduction
selected
intensities
confined
beams
producing
beam
increased
proportion
analyte
compared
carrier
gas
disclosed
specifically
step
addition
charge
transfer
combination
accepts
minimally
selectively
neutralizing
employed
various
analytical
instruments
including
inductively
coupled
plasma
mass
spectrometer
analytical instruments
transfer gas
inductively coupled
mass spectrometer
carrier gas
coupled plasma
charge transfer
selectively neutralizing
analytical instrument
increased proportion
/250/