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Method for reduction of selected ion intensities in confined ion beams

Patent ·
OSTI ID:871633
 [1];  [1];  [1]
  1. Richland, WA
+ Show Author Affiliations
A method for producing an ion beam having an increased proportion of analyte ions compared to carrier gas ions is disclosed. Specifically, the method has the step of addition of a charge transfer gas to the carrier analyte combination that accepts charge from the carrier gas ions yet minimally accepts charge from the analyte ions thereby selectively neutralizing the carrier gas ions. Also disclosed is the method as employed in various analytical instruments including an inductively coupled plasma mass spectrometer.
Research Organization:
Pacific Northwest National Laboratory (PNNL), Richland, WA
DOE Contract Number:
AC06-76RL01830
Assignee:
Battelle Memorial Institute (Richland, WA)
Patent Number(s):
US 5767512
OSTI ID:
871633
Country of Publication:
United States
Language:
English

References (9)

The role of desolvation and hydrogen addition on the excitation features of the inductively coupled plasma journal January 1988
Effects of hydrogen mixed with argon carrier gas in electrothermal vaporization-inductively coupled plasma-mass spectrometry journal April 1992
Fast atom bombardment of solids as an ion source in mass spectrometry journal September 1981
Radio-frequency glow discharge ion trap mass spectrometry journal July 1992
Dissociation of analyte oxide ions in inductively coupled plasma mass spectrometry journal January 1994
Alternatives to all-argon plasmas in inductively coupled plasma mass spectrometry (ICP-MS): an overview journal January 1993
Use of nitrogen and hydrogen in inductively coupled plasma mass spectrometry journal January 1992
Performance of an inductively coupled plasma source ion trap mass spectrometer journal January 1994
Ion-trap mass spectrometry with an inductively coupled plasma source journal January 1994

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