System level latchup mitigation for single event and transient radiation effects on electronics
- Pleasanton, CA
- Livermore, CA
A "blink" technique, analogous to a person blinking at a flash of bright light, is provided for mitigating the effects of single event current latchup and prompt pulse destructive radiation on a micro-electronic circuit. The system includes event detection circuitry, power dump logic circuitry, and energy limiting measures with autonomous recovery. The event detection circuitry includes ionizing radiation pulse detection means for detecting a pulse of ionizing radiation and for providing at an output terminal thereof a detection signal indicative of the detection of a pulse of ionizing radiation. The current sensing circuitry is coupled to the power bus for determining an occurrence of excess current through the power bus caused by ionizing radiation or by ion-induced destructive latchup of a semiconductor device. The power dump circuitry includes power dump logic circuitry having a first input terminal connected to the output terminal of the ionizing radiation pulse detection circuitry and having a second input terminal connected to the output terminal of the current sensing circuitry. The power dump logic circuitry provides an output signal to the input terminal of the circuitry for opening the power bus and the circuitry for shorting the power bus to a ground potential to remove power from the power bus. The energy limiting circuitry with autonomous recovery includes circuitry for opening the power bus and circuitry for shorting the power bus to a ground potential. The circuitry for opening the power bus and circuitry for shorting the power bus to a ground potential includes a series FET and a shunt FET. The invention provides for self-contained sensing for latchup, first removal of power to protect latched components, and autonomous recovery to enable transparent operation of other system elements.
- Research Organization:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- DOE Contract Number:
- W-7405-ENG-48
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Number(s):
- US 5672918
- OSTI ID:
- 871162
- Country of Publication:
- United States
- Language:
- English
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System level latchup mitigation for single event and transient radiation effects on electronics
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latchup
mitigation
single
event
transient
radiation
effects
electronics
blink
technique
analogous
person
blinking
flash
bright
light
provided
mitigating
current
prompt
pulse
destructive
micro-electronic
circuit
detection
circuitry
power
dump
logic
energy
limiting
measures
autonomous
recovery
ionizing
means
detecting
providing
output
terminal
signal
indicative
sensing
coupled
bus
determining
occurrence
excess
caused
ion-induced
semiconductor
device
input
connected
provides
shorting
ground
potential
remove
series
fet
shunt
self-contained
removal
protect
latched
components
enable
transparent
operation
elements
input terminal
logic circuitry
pulse detection
ground potential
detection means
electronic circuit
output terminal
output signal
semiconductor device
ionizing radiation
signal indicative
current sensing
detection circuitry
single event
logic circuit
radiation pulse
detection circuit
terminal connected
detection signal
excess cu
bright light
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