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Apparatus for controlling the scan width of a scanning laser beam

Patent ·
OSTI ID:870656
 [1]
  1. Livermore, CA
+ Show Author Affiliations

Swept-wavelength lasers are often used in absorption spectroscopy applications. In experiments where high accuracy is required, it is desirable to continuously monitor and control the range of wavelengths scanned (the scan width). A system has been demonstrated whereby the scan width of a swept ring-dye laser, or semiconductor diode laser, can be measured and controlled in real-time with a resolution better than 0.1%. Scan linearity, or conformity to a nonlinear scan waveform, can be measured and controlled. The system of the invention consists of a Fabry-Perot interferometer, three CAMAC interface modules, and a microcomputer running a simple analysis and proportional-integral control algorithm. With additional modules, multiple lasers can be simultaneously controlled. The invention also includes an embodiment implemented on an ordinary PC with a multifunction plug-in board.

Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA
DOE Contract Number:
W-7405-ENG-48
Assignee:
United States of America as represented by United States (Washington, DC)
Patent Number(s):
US 5568255
OSTI ID:
870656
Country of Publication:
United States
Language:
English

References (1)

Direct optical measurement of sodium hyperfine structure using a cw dye laser and an atomic beam journal April 1973

Similar Records

Apparatus for controlling the scan width of a scanning laser beam
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Linear scan control of tunable lasers using a scanning Fabry-Perot
Journal Article · Tue May 15 00:00:00 EDT 1979 · Appl. Opt.; (United States) · OSTI ID:6226233
Long-term frequency and intensity stabilization of a cw dye laser
Journal Article · Wed Mar 31 23:00:00 EST 1976 · J. Appl. Phys., v. 47, no. 4, pp. 1464-1466 · OSTI ID:4074174

Related Subjects

/356/372/
absorption
absorption spectroscopy
accuracy
additional
algorithm
analysis
apparatus
applications
beam
board
camac
conformity
consists
continuously
continuously monitor
control
control algorithm
controlled
controlling
demonstrated
desirable
diode
diode laser
dye laser
embodiment
experiments
fabry-perot
fabry-perot interferometer
implemented
interface
interface module
interferometer
laser
laser beam
lasers
linearity
measured
microcomputer
modules
monitor
multifunction
multiple
multiple laser
multiple lasers
nonlinear
ordinary
pc
plug-in
proportional-integral
range
real-time
required
resolution
ring-dye
running
scan
scan line
scanned
scanning
scanning laser
semiconductor
semiconductor diode
simple
simultaneously
spectroscopy
spectroscopy applications
swept
swept-wavelength
waveform
wavelength laser
wavelength lasers
wavelengths
whereby
width