Method and apparatus for differential spectroscopic atomic-imaging using scanning tunneling microscopy
- Lakewood, CO
A Method and apparatus for differential spectroscopic atomic-imaging is disclosed for spatial resolution and imaging for display not only individual atoms on a sample surface, but also bonding and the specific atomic species in such bond. The apparatus includes a scanning tunneling microscope (STM) that is modified to include photon biasing, preferably a tuneable laser, modulating electronic surface biasing for the sample, and temperature biasing, preferably a vibration-free refrigerated sample mounting stage. Computer control and data processing and visual display components are also included. The method includes modulating the electronic bias voltage with and without selected photon wavelengths and frequency biasing under a stabilizing (usually cold) bias temperature to detect bonding and specific atomic species in the bonds as the STM rasters the sample. This data is processed along with atomic spatial topography data obtained from the STM raster scan to create a real-time visual image of the atoms on the sample surface.
- Research Organization:
- Midwest Research Institute, Kansas City, MO (United States)
- DOE Contract Number:
- AC02-83CH10093
- Assignee:
- Midwest Research Institute (Kansas City, MO)
- Patent Number(s):
- US 4942299
- OSTI ID:
- 867462
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
apparatus
differential
spectroscopic
atomic-imaging
scanning
tunneling
microscopy
disclosed
spatial
resolution
imaging
display
individual
atoms
sample
surface
bonding
specific
atomic
species
bond
microscope
stm
modified
photon
biasing
preferably
tuneable
laser
modulating
electronic
temperature
vibration-free
refrigerated
mounting
stage
computer
control
data
processing
visual
components
included
bias
voltage
selected
wavelengths
frequency
stabilizing
cold
detect
bonds
rasters
processed
topography
obtained
raster
scan
create
real-time
image
scanning tunneling
visual display
sample surface
tunneling microscope
atomic species
data processing
data obtained
spatial resolution
bias voltage
computer control
specific atomic
sample mount
mounting stage
spectroscopic atomic-imaging
raster scan
visual image
temperature bias
photon bias
photon biasing
differential spectroscopic
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