High pressure xenon ionization detector

Patent · Sat Dec 31 23:00:00 EST 1988

OSTI ID:867180

Markey, John K ^[1]

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1. New Haven, CT

A method is provided for detecting ionization comprising allowing particles that cause ionization to contact high pressure xenon maintained at or near its critical point and measuring the amount of ionization. An apparatus is provided for detecting ionization, the apparatus comprising a vessel containing a ionizable medium, the vessel having an inlet to allow high pressure ionizable medium to enter the vessel, a means to permit particles that cause ionization of the medium to enter the vessel, an anode, a cathode, a grid and a plurality of annular field shaping rings, the field shaping rings being electrically isolated from one another, the anode, cathode, grid and field shaping rings being electrically isolated from one another in order to form an electric field between the cathode and the anode, the electric field originating at the anode and terminating at the cathode, the grid being disposed between the cathode and the anode, the field shaping rings being disposed between the cathode and the grid, the improvement comprising the medium being xenon and the vessel being maintained at a pressure of 50 to 70 atmospheres and a temperature of 0.degree. to 30.degree. C.

• Research Organization: Yale University
• DOE Contract Number: AC02-76ER03074
• Assignee: Yale University (New Haven, CT)
• Patent Number(s): US 4880983
• OSTI ID: 867180
• Country of Publication: United States
• Language: English

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30
50
70
allow
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atmospheres
cathode
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contact
containing
critical
degree
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electric
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electrically
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enter
field
field shaping
form
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isolated
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means
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medium
method
near
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permit
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rings
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temperature
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vessel
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xenon