Optical fiber sensor technique for strain measurement
Patent
·
OSTI ID:867015
- Albuquerque, NM
Laser light from a common source is split and conveyed through two similar optical fibers and emitted at their respective ends to form an interference pattern, one of the optical fibers having a portion thereof subjected to a strain. Changes in the strain cause changes in the optical path length of the strain fiber, and generate corresponding changes in the interference pattern. The interference pattern is received and transduced into signals representative of fringe shifts corresponding to changes in the strain experienced by the strained one of the optical fibers. These signals are then processed to evaluate strain as a function of time, typical examples of the application of the apparatus including electrodeposition of a metallic film on a conductive surface provided on the outside of the optical fiber being strained, so that strains generated in the optical fiber during the course of the electrodeposition are measurable as a function of time. In one aspect of the invention, signals relating to the fringe shift are stored for subsequent processing and analysis, whereas in another aspect of the invention the signals are processed for real-time display of the strain changes under study.
- Research Organization:
- AT & T CORP
- DOE Contract Number:
- AC04-76DP00789
- Assignee:
- United States of America as represented by Department of Energy (Washington, DC)
- Patent Number(s):
- US 4841778
- OSTI ID:
- 867015
- Country of Publication:
- United States
- Language:
- English
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analysis
apparatus
apparatus including
application
aspect
changes
common
common source
conductive
conductive surface
conveyed
corresponding
corresponding change
course
display
electrodeposition
emitted
evaluate
examples
experienced
fiber
fiber sensor
fibers
film
form
fringe
function
generate
generated
including
interference
interference pattern
laser
laser light
length
light
measurable
measurement
metallic
metallic film
optical
optical fiber
optical fibers
optical path
outside
path
path length
pattern
portion
processed
processing
provided
rate corresponding
real-time
received
relating
representative
respective
sensor
shift
shifts
signals
signals representative
similar
similar optical
source
split
stored
strain
strained
strains
study
subjected
subsequent
subsequent process
surface
technique
time
transduced
typical
analysis
apparatus
apparatus including
application
aspect
changes
common
common source
conductive
conductive surface
conveyed
corresponding
corresponding change
course
display
electrodeposition
emitted
evaluate
examples
experienced
fiber
fiber sensor
fibers
film
form
fringe
function
generate
generated
including
interference
interference pattern
laser
laser light
length
light
measurable
measurement
metallic
metallic film
optical
optical fiber
optical fibers
optical path
outside
path
path length
pattern
portion
processed
processing
provided
rate corresponding
real-time
received
relating
representative
respective
sensor
shift
shifts
signals
signals representative
similar
similar optical
source
split
stored
strain
strained
strains
study
subjected
subsequent
subsequent process
surface
technique
time
transduced
typical