Coded aperture imaging with self-supporting uniformly redundant arrays
Patent
·
OSTI ID:864591
- Los Alamos, NM
A self-supporting uniformly redundant array pattern for coded aperture imaging. The present invention utilizes holes which are an integer times smaller in each direction than holes in conventional URA patterns. A balance correlation function is generated where holes are represented by 1's, nonholes are represented by -1's, and supporting area is represented by 0's. The self-supporting array can be used for low energy applications where substrates would greatly reduce throughput. The balance correlation response function for the self-supporting array pattern provides an accurate representation of the source of nonfocusable radiation.
- Research Organization:
- Los Alamos National Laboratory (LANL), Los Alamos, NM
- DOE Contract Number:
- W-7405-ENG-36
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Number(s):
- US 4389633
- OSTI ID:
- 864591
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
-1
/382/250/359/
accurate
aperture
aperture imaging
applications
array
array pattern
arrays
balance
coded
coded aperture
conventional
correlation
direction
energy
function
generated
greatly
greatly reduce
holes
imaging
integer
nonfocusable
nonholes
pattern
patterns
provides
radiation
reduce
redundant
redundant array
redundant arrays
representation
represented
response
response function
self-supporting
self-supporting uniformly
source
substrates
supporting
throughput
times
uniformly
uniformly redundant
ura
utilizes
/382/250/359/
accurate
aperture
aperture imaging
applications
array
array pattern
arrays
balance
coded
coded aperture
conventional
correlation
direction
energy
function
generated
greatly
greatly reduce
holes
imaging
integer
nonfocusable
nonholes
pattern
patterns
provides
radiation
reduce
redundant
redundant array
redundant arrays
representation
represented
response
response function
self-supporting
self-supporting uniformly
source
substrates
supporting
throughput
times
uniformly
uniformly redundant
ura
utilizes