Temperature profile detector

Patent · Fri Dec 31 23:00:00 EST 1982

OSTI ID:864579

Tokarz, Richard D ^[1]

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1. West Richland, WA

Temperature profiles at elevated temperature conditions are monitored by use of an elongated device having two conductors spaced by the minimum distance required to normally maintain an open circuit between them. The melting point of one conductor is selected at the elevated temperature being detected, while the melting point of the other is higher. As the preselected temperature is reached, liquid metal will flow between the conductors, creating short circuits which are detectable as to location.

• Research Organization: Pacific Northwest National Laboratory (PNNL), Richland, WA
• DOE Contract Number: EY-76-C-06-1830
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 4388267
• OSTI ID: 864579
• Country of Publication: United States
• Language: English

Related Subjects

/376/324/340/374/976/
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