Latin square three dimensional gage master
Patent
·
OSTI ID:864438
- Lexena, KS
A gage master for coordinate measuring machines has an nxn array of objects distributed in the Z coordinate utilizing the concept of a Latin square experimental design. Using analysis of variance techniques, the invention may be used to identify sources of error in machine geometry and quantify machine accuracy.
- Research Organization:
- Kansas City Plant (KCP), Kansas City, MO (United States)
- DOE Contract Number:
- AC04-76DP00613
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Number(s):
- US 4364182
- OSTI ID:
- 864438
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
/33/73/
accuracy
analysis
array
concept
coordinate
coordinate measuring
design
dimensional
distributed
error
experimental
gage
gage master
geometry
identify
latin
latin square
machine
machines
master
measuring
measuring machine
measuring machines
nxn
quantify
sources
square
techniques
utilizing
variance
z
accuracy
analysis
array
concept
coordinate
coordinate measuring
design
dimensional
distributed
error
experimental
gage
gage master
geometry
identify
latin
latin square
machine
machines
master
measuring
measuring machine
measuring machines
nxn
quantify
sources
square
techniques
utilizing
variance
z