Capacitance densitometer for flow regime identification

Patent · Sun Jan 01 00:00:00 EST 1978

OSTI ID:863018

Shipp, Jr., Roy L. ^[1]

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1. (Oak Ridge, TN)

This invention relates to a capacitance densitometer for determining the flow regime of a two-phase flow system. A two-element capacitance densitometer is used in conjunction with a conventional single-beam gamma densitometer to unambiguously identify the prevailing flow regime and the average density of a flowing fluid.

• Research Organization: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 4075680
• OSTI ID: 863018
• Country of Publication: United States
• Language: English

Related Subjects

capacitance
densitometer
flow
regime
identification
relates
determining
two-phase
two-element
conjunction
conventional
single-beam
gamma
unambiguously
identify
prevailing
average
density
flowing
fluid
flow regime
flowing fluid
two-phase flow
capacitance densitometer
phase flow
conventional single
average density
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