Ab initio study of low-energy electron collisions withtertafluoroethene, C2F4
Journal Article
·
· Physical Review A
OSTI ID:860469
We report the results of variational calculations of elastic electron scattering by tetrafluoroethene, C{sub 2}F{sub 4}, with incident electron energies ranging from 0.5 to 20 eV, using the complex Kohn method and effective core potentials. These are the first fully calculations to reproduce experimental angular differential cross sections at energies below 10 eV. Low-energy electron scattering by C{sub 2}F{sub 4} is sensitive to the inclusion of electronic correlation and target-distortion effects. We therefore present results that describe the dynamic polarization of the target by the incident electron. The calculated cross sections are compared with recent experimental measurements.
- Research Organization:
- Ernest Orlando Lawrence Berkeley NationalLaboratory, Berkeley, CA (US)
- Sponsoring Organization:
- USDOEDirector. Office of Science. Office of Basic EnergySciences. Chemical Sciences Geosciences and Biosciences Division; National Science Foundation Grant PHY-99-87877
- DOE Contract Number:
- AC02-05CH11231
- OSTI ID:
- 860469
- Report Number(s):
- LBNL--55185; BnR: KC0301030
- Journal Information:
- Physical Review A, Journal Name: Physical Review A Journal Issue: 1 Vol. 7001; ISSN 1050-2947; ISSN PLRAAN
- Country of Publication:
- United States
- Language:
- English
Similar Records
Ab initio study of low-energy electron collisions with tetrafluoroethene C{sub 2}F{sub 4}
Ab initio study of low-energy electron collisions with ethylene
Ab initio study of low-energy electron-ethane scattering
Journal Article
·
Thu Jul 01 00:00:00 EDT 2004
· Physical Review. A
·
OSTI ID:20643904
Ab initio study of low-energy electron collisions with ethylene
Journal Article
·
Sun Nov 30 23:00:00 EST 2003
· Physical Review. A
·
OSTI ID:20640488
Ab initio study of low-energy electron-ethane scattering
Journal Article
·
Thu Oct 15 00:00:00 EDT 1992
· Journal of Chemical Physics; (United States)
·
OSTI ID:7011459