Spatially Interpolated Nonlinear Anodization in Synthetic Aperture Radar Imagery
- Sandia National Laboratories
Spatially Interpolated Nonlinear Anodization in Synthetic Aperture Original formulation of spatially variant anodization for complex synthetic aperture radar (SAR) imagery oversampled at twice the Nyquist rate (2.OX). Here we report a spatially interpolating, noninteger-oversampled SVA sidelobe. The pixel's apparent IPR location is assessed by comparing its value to the sum of its value plus weighted comparable for exact interpolation. However, exact interpolation implies an ideal sine interpolator3 and large components may not be necessary. Note that P is the summation of IPR diagonal values. The value of a sine IPR on the diagonals is a sine-squared; values much less than cardinal direction (m, n) values. This implies that cardinal direction interpolation requires higher precision than diagonal interpolation. Consequently, we employed a smaller set. The spatially interpolated SVA used an 8-point/4-point sine interpolator described above. Table 1 shows the Table 1 results show a two-times speed-up using the 1.3x oversampled and spatially interpolated SVA over the Figure 1d. Detected results of 1.3x oversampled sine interpolated spatially variant
- Research Organization:
- Sandia National Labs., Albuquerque, NM (US); Sandia National Labs., Livermore, CA (US)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 8407
- Report Number(s):
- SAND99-1629J
- Journal Information:
- Optics Letters, Journal Name: Optics Letters
- Country of Publication:
- United States
- Language:
- English
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