Substrate effects on the structure of epitaxial PbTiO{sub 3} thin films prepared on MgO, LaAlO{sub 3}, and SrTiO{sub 3} by metalorganic chemical-vapor deposition
- Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
The refractive indices and optical birefringence of the films were measured as a function of wavelength using the film-prism coupling method. Both the ordinary and extraordinary refractive indices for films grown on MgO(001) and LaAlO{sub 3}(001) were higher than that of single-crystal PbTiO{sub 3}; however, the optical birefringence of films grown on MgO(001) was reduced from that of the bulk. For films grown on SrTiO{sub 3}(001), the ordinary refractive index was very close to that of single-crystal PbTiO{sub 3}. We correlate the refractive index values and the reduced birefringence to the degree of residual strain and the volume fraction of 90{degree} domains in the samples, respectively. {copyright} {ital 1995} {ital American} {ital Institute} {ital of} {ital Physics}.
- DOE Contract Number:
- W-31-109-ENG-38
- OSTI ID:
- 83906
- Journal Information:
- Journal of Applied Physics, Vol. 78, Issue 4; Other Information: PBD: 15 Aug 1995
- Country of Publication:
- United States
- Language:
- English
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