Characterization of SEI layers on LiMn2O4 cathodes with in-situ spectroscopic ellipsometry
- LBNL Library
In situ spectroscopic ellipsometry was employed to study the initial stage of SEI layer formation on thin-film LiMn{sub 2}O{sub 4} electrodes. It was found that the SEI layer formed immediately upon exposure of the electrode to EC/DMC (1:1 by vol) 1.0 M LiPF{sub 6} electrolyte. The SEI layer thickness then increased in proportion to a logarithmic function of elapsed time. In comparison, the SEI layer thickness on a cycled electrode increased in proportion to a linear function of the number of cycles.
- Research Organization:
- Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (US)
- Sponsoring Organization:
- USDOE. Assistant Secretary for Energy Efficiency and Renewable Energy. Office of the Deputy Assistant Secretary for Technology Development. Office of the FreedomCAR and Vehicle Technology Program (US)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 837416
- Report Number(s):
- LBNL--55939
- Country of Publication:
- United States
- Language:
- English
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