Seeing atoms only 0.78A apart
- LBNL Library
The one-Angstrom microscope (OAM) project at the USDOE's National Center for Electron Microscopy has extended the limits of high-resolution transmission electron microscopy to sub-Angstrom levels. The OAM combines image-processing software with a modified 300keV electron microscope equipped with a highly-coherent field-emission electron gun. We have found that a reduction in the OAM's electron-gun extraction voltage allows us to ''see'' silicon atoms separated by only 0.78A.
- Research Organization:
- Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (US)
- Sponsoring Organization:
- USDOE Director. Office of Science. Office of Basic Energy Sciences (US)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 835992
- Report Number(s):
- LBNL--52325
- Country of Publication:
- United States
- Language:
- English
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