Laser modulated scattering as a nondestructive evaluation tool for optical surfaces and thin film coatings

Conference · Wed Dec 22 00:00:00 EST 1999

OSTI ID:8355

Feit, M D; Kozlowski, M R; Rubenchik, A M; Sheehan, L; Wu, Z L

Laser modulated scattering (LMS) is introduced as a non-destructive evaluation tool for defect inspection and characterization of optical surfaces and thin film coatings. This technique is a scatter sensitive version of the well-known photothermal microscopy (PTM) technique. It allows simultaneous measurement of the DC and AC scattering signals of a probe laser beam from an optical surface. By comparison between the DC and AC scattering signals, one can differentiate absorptive defects from non-absorptive ones. This paper describes the principle of the LMS technique and the experimental setup, and illustrates examples on using LMS as a tool for nondestructive evaluation of high quality optics.

• Research Organization: Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
• Sponsoring Organization: USDOE Office of Defense Programs (DP)
• DOE Contract Number: W-7405-Eng-48
• OSTI ID: 8355
• Report Number(s): UCRL-JC-131211; DP0212000; 98-ERD-063; ON: DE00008355
• Resource Relation: Conference: 30th Boulder Damage Symposium: Annual Symposium on Optical Materials for High Power Lasers, Boulder, CO, September 28-October 1, 1998
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES
Laser Radiation
Scattering
Nondestructive Testing
Thin Films
Optical Equipment
Coatings
Surfaces
Defects
Damage