Origin of the {Tc}-depression in ultrathin YBCO
- Rutgers Univ., Piscataway, NJ (United States)
Conductance measurements on YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} (YBCO) between layers of Y{sub 1{minus}x}Pr{sub x}Ba{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} [(Y-Pr)BCO] show a transition from a bulk regime in the interior of the YBCO to a surface regime near the interfaces. The depression of the zero-resistance transition temperature in ultrathin YBCO is correlated with the depressed conductance in the surface layer. The results indicate that the changes are related to the presence of the interfaces, primarily to charge transfer between the layers, with little, if any, indication of a change in the intrinsic properties of the YBCO from bulk down to the thickness of a single unit cell.
- OSTI ID:
- 82843
- Report Number(s):
- CONF-940142--; ISBN 0-8194-1452-2
- Country of Publication:
- United States
- Language:
- English
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