Performance of the advanced photon source (APS) linac beam position monitors (BPMs) with logarithmic amplifier electronics
Conference
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OSTI ID:82342
This paper discusses the performance of the logarithmic amplifier electronics system used with stripline BPMs to measure electron and positron beam positions at the APS linac. The 2856-MHz, S-band linac accelerates 30-nsec pulses of 1.7 A of electrons to 200 MeV, and focuses them onto a positron conversion target. The resulting 8 mA of positrons are further accelerated to 450 MeV by the positron linac. Beam position resolutions of 50 {mu}m are easily obtainable in both the electron and positron linacs. The resolution of the 12-bit A/D converters limits the ultimate beam positron resolution to between 20 and 30 {mu}m at this time.
- Research Organization:
- Argonne National Lab., IL (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 82342
- Report Number(s):
- ANL/ASD/CP--85097; CONF-950512--239; ON: DE95013782
- Country of Publication:
- United States
- Language:
- English
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Calibration of an advanced photon source linac beam position monitor used for positron position measurement of a beam containing both positrons and electrons
Calibration of an Advanced Photon Source linac beam position monitor used for positron position measurement of a beam containing both positrons and electrons.
Calibration of an advanced photon source linac beam position monitor used for positron position measurement of a beam containing both positrons and electrons
Journal Article
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Wed Dec 09 23:00:00 EST 1998
· AIP Conference Proceedings
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OSTI ID:21202380
Calibration of an Advanced Photon Source linac beam position monitor used for positron position measurement of a beam containing both positrons and electrons.
Conference
·
Tue May 19 00:00:00 EDT 1998
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OSTI ID:10695
Calibration of an advanced photon source linac beam position monitor used for positron position measurement of a beam containing both positrons and electrons
Journal Article
·
Mon Nov 30 23:00:00 EST 1998
· AIP Conference Proceedings
·
OSTI ID:348219