In-situ Photoexcitation-Induced Perturbations of Defect Complex Concentration and Distribution in Silicon Implanted with Light and Heavy Ions
Journal Article
·
· Solid State Phenomena
OSTI ID:816848
No abstract prepared.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 816848
- Report Number(s):
- P00-106144; TRN: US0602127
- Journal Information:
- Solid State Phenomena, Vol. 70; ISSN 1012-0394
- Country of Publication:
- United States
- Language:
- English
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