Skip to main content
OSTI.GOVU.S. Department of Energy Office of Scientific and Technical Information
U.S. Department of Energy
Office of Scientific and Technical Information
 

Fluctuation microscopy studies of medium-range order structures in amorphous tetrahedral semiconductors.

Conference ·
OSTI ID:813771
; ; ; ;

No abstract prepared.

Research Organization:
Argonne National Lab., IL (US)
Sponsoring Organization:
US Department of Energy (US)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
813771
Report Number(s):
ANL/MSD/CP-104110
Country of Publication:
United States
Language:
English

Similar Records

Medium-range order in hydrogenated amorphous silicon measured by fluctuation microscopy
Conference · Mon Apr 17 00:00:00 EDT 2000 · OSTI ID:754474
Fluctuation microscopy - a tool for examining medium-range order innoncrystalline systems.
Conference · Fri Oct 15 00:00:00 EDT 2004 · OSTI ID:898124
Fluctuation microscopy studies of amorphous diamond-like carbon films.
Conference · Tue Feb 13 23:00:00 EST 2001 · OSTI ID:813739

Related Subjects

36 MATERIALS SCIENCE
AMORPHOUS STATE
MICROSCOPY
ORDER PARAMETERS
SEMICONDUCTOR MATERIALS