DIRECT DETERMINATION OF THE STACKING ORDER IN GD2O3 EPI LAYERS ON GAAS.
Conference
·
OSTI ID:806194
- BROOKHAVEN NATIONAL LABORATORY
We have used Coherent Bragg Rod Analysis (COBRA) to investigate the atomic structure of a 5.6 nm thick Gd{sub 2}O{sub 3} film epitaxially grown on a (100) GaAs substrate. COBRA is a method to directly obtain the structure of systems periodic in two-dimensions by determining the complex scattering factors along the substrate Bragg rods. The system electron density and atomic structure are obtained by Fourier transforming the complex scattering factors into real space. The results show that the stacking order of the first seven Gd{sub 2}O{sub 3} film layers resembles the stacking order of Ga and As layers in GaAs then changes to the stacking order of cubic bulk Gd{sub 2}O{sub 3}. This behavior is distinctly different from the measured stacking order in a 2.7 nm thick Gd{sub 2}O{sub 3} in which the GaAs stacking order persists throughout the entire film.
- Research Organization:
- Brookhaven National Lab., Upton, NY (US)
- Sponsoring Organization:
- USDOE Office of Energy Research (ER) (US)
- DOE Contract Number:
- AC02-98CH10886
- OSTI ID:
- 806194
- Report Number(s):
- BNL--69489; KC0204011
- Country of Publication:
- United States
- Language:
- English
Similar Records
Direct determination of the stacking order in Gd{sub 2}O{sub 3} epi-layers on GaAs.
High-efficiency AlGaAs-GaAs solar cells with internal Bragg reflector
Ultra-thin distributed Bragg reflectors via stacked single-crystal silicon nanomembranes
Conference
·
Tue Dec 31 23:00:00 EST 2002
·
OSTI ID:925063
High-efficiency AlGaAs-GaAs solar cells with internal Bragg reflector
Conference
·
Fri Dec 30 23:00:00 EST 1994
·
OSTI ID:191149
Ultra-thin distributed Bragg reflectors via stacked single-crystal silicon nanomembranes
Journal Article
·
Mon May 04 00:00:00 EDT 2015
· Applied Physics Letters
·
OSTI ID:22398990