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Title: Electrical characterization of irradiated prototype silicon pixel sensors for BTeV

Conference ·
OSTI ID:804444

The pixel detector in the BteV experiment at the Tevatron (Fermi Laboratory) is an important detector component for high-resolution tracking and vertex identification. For this task the hybrid pixel detector has to work in a very harsh radiation environment with up to 10{sup 14} minimum ionizing particles/cm{sup 2}/year. Radiation hardness of prototype n{sup +}/n/p{sup +} silicon pixel sensors has been investigated. We present Electrical characterization curves for irradiated prototype n{sup +}/n/p{sup +} sensors, intended for use in the BTeV experiment. We tested pixel sensors from various vendors and with two pixel isolation techniques: p-stop and p-spray. Results are based on irradiation with 200 MeV protons up to 6 x 10{sup 14} protons/cm{sup 2}.

Research Organization:
Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Organization:
USDOE Office of Energy Research (ER) (US)
DOE Contract Number:
AC02-76CH03000
OSTI ID:
804444
Report Number(s):
FERMILAB-Conf-02/281-E; TRN: US0205303
Resource Relation:
Conference: 2002 IEEE Nuclear Science Symposium and Medical Imaging Conference, Norfolk, VA (US), 11/10/2002--11/16/2002; Other Information: PBD: 13 Nov 2002
Country of Publication:
United States
Language:
English

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