Resonant Inelastic Scattering in Dilute Magnetic Semiconductors By Soft X-Ray Fluorescence Spectroscopy
Journal Article
·
· Applied Physics A: Materials Science & Processing
OSTI ID:800635
No abstract prepared.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 800635
- Report Number(s):
- LBNL-39756; LBNL/ALS-719; TRN: US200217%%850
- Journal Information:
- Applied Physics A: Materials Science & Processing, Vol. 65, Issue 2; Other Information: Journal Publication Date: August 1997; PBD: 1 Dec 1996
- Country of Publication:
- United States
- Language:
- English
Similar Records
Resonant inelastic scattering in dilute magnetic semiconductors by x-ray fluorescence spectroscopy
Resonant inelastic x-ray scattering in hexagonal boron nitride observed by soft x-ray fluorescence spectroscopy
Resonant Inelastic Scattering at the L Edge of Ti in Barium Strontium Titanate by Soft X-Ray Fluorescence Spectroscopy
Technical Report
·
Tue Apr 01 00:00:00 EST 1997
·
OSTI ID:800635
Resonant inelastic x-ray scattering in hexagonal boron nitride observed by soft x-ray fluorescence spectroscopy
Journal Article
·
Fri Nov 03 00:00:00 EST 1995
· Physical Review Letters
·
OSTI ID:800635
+6 more
Resonant Inelastic Scattering at the L Edge of Ti in Barium Strontium Titanate by Soft X-Ray Fluorescence Spectroscopy
Journal Article
·
Mon Dec 02 00:00:00 EST 1996
· Applied Physics A
·
OSTI ID:800635
+6 more