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X-ray absorption spectroscopy and atomic force microscopy study of bias-enhanced nucleation of diamond films

Journal Article · Tue Mar 31 23:00:00 EST 1998 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.121290· OSTI ID:800288

Garcia, M M ^[1]; Jimenez, I; Vazquez, L; Gomez-Aleixandre, C; Albella, J M; Sanchez, O; Terminello, Louis J; Himpsel, Franz J

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Research Organization:: Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (US)

Sponsoring Organization:: US Department of Energy (US)

DOE Contract Number:: AC03-76SF00098

OSTI ID:: 800288

Report Number(s):: LBNL/ALS--23184

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 17 Vol. 72; ISSN APPLAB; ISSN 0003-6951

Country of Publication:: United States

Language:: English

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Related Subjects

43 PARTICLE ACCELERATORS
ABSORPTION SPECTROSCOPY
ADVANCED LIGHT SOURCE
ADVANCED LIGHT SOURCE ALS
ATOMIC FORCE MICROSCOPY
DIAMONDS
NUCLEATION