In-situ and ex-situ characterization of thin films by soft x-ray emission spectroscopy

Journal Article · Sun Oct 01 00:00:00 EDT 2000 · Journal of Electron Spectroscopy and Related Phenomena

DOI:https://doi.org/10.1016/S0368-2048(00)00156-0· OSTI ID:800122

Guo, J -H ^[1]; Skytt, Per I; Wassdahl, Nial; Nordgren, Joseph E

---

1. LBNL Library

No abstract prepared.

• Research Organization: Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (US)
• Sponsoring Organization: US Department of Energy (US)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 800122
• Report Number(s): LBNL/ALS--13028
• Journal Information: Journal of Electron Spectroscopy and Related Phenomena, Journal Name: Journal of Electron Spectroscopy and Related Phenomena Journal Issue: 1-3 Vol. 110-111; ISSN JESRAW; ISSN 0368-2048
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
ADVANCED LIGHT SOURCE
ADVANCED LIGHT SOURCE ALS
EMISSION SPECTROSCOPY
THIN FILMS