In-situ and ex-situ characterization of thin films by soft x-ray emission spectroscopy
Journal Article
·
· Journal of Electron Spectroscopy and Related Phenomena
No abstract prepared.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 800122
- Report Number(s):
- LBNL/ALS-13028; JESRAW; TRN: US0202367
- Journal Information:
- Journal of Electron Spectroscopy and Related Phenomena, Vol. 110-111, Issue 1-3; Other Information: Journal Publication Date: October 2000; PBD: 1 Oct 2000; ISSN 0368-2048
- Country of Publication:
- United States
- Language:
- English
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