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Chirped-Beam Two-Stage SASE-FEL for High Power Femtosecond X-Ray Pulse Generation

Technical Report ·
DOI:https://doi.org/10.2172/800011· OSTI ID:800011

We present a method for generating femtosecond duration x-ray pulses using a single-pass free-electron laser (FEL). This method uses an energy-chirped electron beam to produce a frequency-chirped x-ray pulse through self-amplified spontaneous emission (SASE). After the undulator we consider passing the radiation through a monochromator. The frequency is correlated to the longitudinal position within the pulse, and therefore, by selecting a narrow bandwidth, a short temporal pulse will be transmitted. The short pulse radiation is used to seed a second undulator, where the radiation is amplified to saturation. In addition to short pulse generation, this scheme has the ability to control shot-to-shot fluctuations in the central wavelength due to electron beam energy jitter. We present calculations of the radiation characteristics produced by a chirped-beam two-stage SASE-FEL, and consider the performance of the chirped-beam two-stage option for the Linac Coherent Light Source (LCLS).

Research Organization:
Stanford Linear Accelerator Center, Menlo Park, CA (US)
Sponsoring Organization:
USDOE Office of Energy Research (ER) (US)
DOE Contract Number:
AC03-76SF00515
OSTI ID:
800011
Report Number(s):
SLAC-PUB-9370
Country of Publication:
United States
Language:
English

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