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Title: Time-resolved spectroscopy of scintillation materials using x-ray synchrotron radiation

Book ·
OSTI ID:79864
; ;  [1];  [2]
  1. Moscow State Univ. (Russian Federation)
  2. Inst. for Nuclear Physics, Novosibirsk (Russian Federation)

The time-resolved luminescence spectra and decay kinetics of BaF{sub 2}, BGO, and CeF{sub 3}, were measured with the dissector technique using X-ray synchrotron radiation (SR) of different spectral composition from wiggler mounted at VEPP-3 storage ring (Novosibirsk). Two effects of X-ray excitation energy on the luminescence parameters were observed: modifications of the emission spectrum and acceleration of decay kinetics. Under the excitation by soil X-ray SR the 220 nm emission band for BaF{sub 2} is broadened, whereas shorter wavelength part of CeF{sub 3} and BGO emission spectra increases. For luminescence decay of excitons and chemiluminescence the degree of the deviation from the single exponential law depends on the photon energies and increases under soft X-ray excitation as well. These effects are supposed to be due to the interaction of electronic excitations created after the relaxation of deep core holes. Fast intrinsic luminescence was observed for CdI{sub 2} and CsPbCl{sub 3} under X-ray SR excitation. 500 nm band of CdI{sub 2} has characteristic time {tau} = 4.6 ns, whereas 420 nm band of CsPbCl{sub 3} shows very fast decay with {tau} = 0.2 ns.

OSTI ID:
79864
Report Number(s):
CONF-940411-; ISBN 1-55899-248-0; TRN: 95:016640
Resource Relation:
Conference: Spring meeting of the Materials Research Society (MRS), San Francisco, CA (United States), 4-8 Apr 1994; Other Information: PBD: 1994; Related Information: Is Part Of Scintillator and phosphor materials. Materials Research Society symposium proceedings: Volume 348; Weber, M.J. [ed.] [Lawrence Livermore National Lab., CA (United States)]; Lecoq, P. [ed.] [Centre European pour la Recherche Nucleaire, Geneva (Switzerland)]; Ruchti, R.C. [ed.] [Univ. of Notre Dame, IN (United States)]; Woody, C. [ed.] [Brookhaven National Lab., Upton, NY (United States)]; Yen, W.M. [ed.] [Univ. of Georgia, Athens, GA (United States)]; Zhu, R.Y. [ed.] [California Inst. of Technology, Pasadena, CA (United States)]; PB: 580 p.
Country of Publication:
United States
Language:
English