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Possibility of minimal surface contributions to low photon energy angle-resolved photoemission of CeRu{sub 2}Si{sub 2}

Conference ·
OSTI ID:797837
Surface-related effects in angle-resolved valence spectra of CeRu{sub 2}Si{sub 2} at the Ce 4d {yields} 5f resonance threshold for different cleaved surfaces are presented and compared to angle-integrated valence spectra and to bulk-sensitive Ce 3d-edge valence spectra. Evidence that Ce 4d-edge photoemission spectroscopy on ideal cleaved surfaces is dominated by bulk Ce 4f states is presented.
Research Organization:
Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (US)
Sponsoring Organization:
USDOE Director, Office of Science. Office of Basic Energy Studies. Materials Science and Engineering Division; National Science Foundation (US)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
797837
Report Number(s):
LBNL--49192; B& R KC0204016
Country of Publication:
United States
Language:
English

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