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Title: Characterization of thermal distortion effects on beamline optics for EUV interferometry and soft x-ray microscopy

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1147403· OSTI ID:794660

No abstract prepared.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
Sponsoring Organization:
US Department of Energy (US)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
794660
Report Number(s):
LBNL/ALS-236; RSINAK; TRN: US0203480
Journal Information:
Review of Scientific Instruments, Vol. 67; Other Information: Journal Publication Date: 1996; PBD: 1 Jan 1996; ISSN 0034-6748
Country of Publication:
United States
Language:
English