Soft x-ray fluorescence measurements of irradiated polyimide and polycarbosilane films

Journal Article · Tue Jun 01 04:00:00 EDT 1999 · Journal of Electron Spectroscopy and Related Phenomena

DOI:https://doi.org/10.1016/S0368-2048(98)00353-3· OSTI ID:794631

Kurmaev, Ernst Z ^[1]; Winarski, Robert P; Ederer, David L; Pivin, J -C; Shamin, S N; Moewes, Alexander P; Chang, G S; Wang, C N

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1. LBNL Library

No abstract prepared.

• Research Organization: Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (US)
• Sponsoring Organization: US Department of Energy (US)
• DOE Contract Number: AC03-76SF00098
• OSTI ID: 794631
• Report Number(s): LBNL/ALS--1524
• Journal Information: Journal of Electron Spectroscopy and Related Phenomena, Journal Name: Journal of Electron Spectroscopy and Related Phenomena Vol. 103; ISSN JESRAW; ISSN 0368-2048
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
43 PARTICLE ACCELERATORS
ADVANCED LIGHT SOURCE
ADVANCED LIGHT SOURCE ALS
IMIDES
ORGANIC POLYMERS
POST-IRRADIATION EXAMINATION
SILANES
X-RAY FLUORESCENCE ANALYSIS