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Title: MICROSTRUCTURAL CHARACTERIZATION OF YBCO THICK FILM COATED CONDUCTORS ON IBAD-YSZ AND MGO TEMPLATE LAYERS

Abstract

No abstract prepared.

Authors:
; ;
Publication Date:
Research Org.:
Los Alamos National Lab., NM (US)
Sponsoring Org.:
US Department of Energy (US)
OSTI Identifier:
783198
Report Number(s):
LA-UR-01-3074
TRN: US0110528
DOE Contract Number:
W-7405-ENG-36
Resource Type:
Conference
Resource Relation:
Conference: Conference title not supplied, Conference location not supplied, Conference dates not supplied; Other Information: PBD: 1 Jun 2001
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; MICROSTRUCTURE; YTTRIUM OXIDES; BARIUM OXIDES; COPPER OXIDES; ELECTRIC CONDUCTORS; COATINGS; SUBSTRATES; MAGNESIUM OXIDES; YTTRIUM ALLOYS; STRONTIUM ALLOYS; ZIRCONIUM ALLOYS

Citation Formats

H. KUNG, S. R. FOLTYN, and ET AL. MICROSTRUCTURAL CHARACTERIZATION OF YBCO THICK FILM COATED CONDUCTORS ON IBAD-YSZ AND MGO TEMPLATE LAYERS. United States: N. p., 2001. Web.
H. KUNG, S. R. FOLTYN, & ET AL. MICROSTRUCTURAL CHARACTERIZATION OF YBCO THICK FILM COATED CONDUCTORS ON IBAD-YSZ AND MGO TEMPLATE LAYERS. United States.
H. KUNG, S. R. FOLTYN, and ET AL. 2001. "MICROSTRUCTURAL CHARACTERIZATION OF YBCO THICK FILM COATED CONDUCTORS ON IBAD-YSZ AND MGO TEMPLATE LAYERS". United States. doi:. https://www.osti.gov/servlets/purl/783198.
@article{osti_783198,
title = {MICROSTRUCTURAL CHARACTERIZATION OF YBCO THICK FILM COATED CONDUCTORS ON IBAD-YSZ AND MGO TEMPLATE LAYERS},
author = {H. KUNG and S. R. FOLTYN and ET AL},
abstractNote = {No abstract prepared.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = 2001,
month = 6
}

Conference:
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  • We present key improvements to growing high quality ({approx}7 degrees {Delta}{phi}) magnesium oxide (MgO) The use of a new layer for IBAD MgO nucleation and reduction in surface roughness of substrates have resulted in better in-plane texture. The processing window for obtaining optimum template texture is very narrow ({approx}10 seconds) using Si,N,. This has been ameliorated by use of an alternate amorphous nucleation layer. The substrate surface roughness has a significant effect on the initial nucleation texture of IBAD MgO films. A surface roughness of -1 nm has resulted in better in-plane texture for IBAD MgO films deposited on metalmore » substrates. We have also implemented a method to quantify IBAD MgO texture using reflected high-energy electron diffraction (RHEED). Utilizing this in situ tool, we have been able to refine deposition parameters to routinely grow films in batch mode that have a {Delta}{phi} of {approx} 7 degrees. Deposited meter lengths have had {Delta}{phi} values from 7-9 degrees with 10% uniformity. One to two micrometer thick YBCO films on these templates have had critical current densities in excess of 1 MA/cm2 at 75 K, in self field.« less
  • A continuous coating system has been developed for depositing YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} (YBCO) on 1 cm wide flexible tapes up to 113 cm long. The authors best result to date is a 12 cm long tape with a critical current (I{sub c}) of 70 A at 75 K. Variations along the length of the tape limited the overall current, but indicated the potential for long length critical currents in excess of 100 A.
  • One meter long tapes based on 50-100 {micro}m thick by 1 cm wide nickel alloy substrates have been coated in a continuous process with a textured yttria-stabilized zirconia layer by ion beam-assisted deposition, followed by a 1-2 {micro}m thick layer of YBCO by pulsed laser deposition. The best result to date is a tape with a critical current (I{sub c}) at 75 K of 96 A over an 87 cm measurement length. The overall critical current density and engineering current density are 1 MA/cm{sup 2} and 10 kA/cm{sup 2}, respectively. Using a special probe, individual I-V curves were generated formore » each centimeter of tape length in order to investigate longitudinal uniformity of the transport properties: the highest and lowest I{sub c} values fall within a range of {+-}25%.« less