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Title: Computer Generated Inputs for NMIS Processor Verification

Conference ·
OSTI ID:782895

Proper operation of the Nuclear Identification Materials System (NMIS) processor can be verified using computer-generated inputs [BIST (Built-In-Self-Test)] at the digital inputs. Preselected sequences of input pulses to all channels with known correlation functions are compared to the output of the processor. These types of verifications have been utilized in NMIS type correlation processors at the Oak Ridge National Laboratory since 1984. The use of this test confirmed a malfunction in a NMIS processor at the All-Russian Scientific Research Institute of Experimental Physics (VNIIEF) in 1998. The NMIS processor boards were returned to the U.S. for repair and subsequently used in NMIS passive and active measurements with Pu at VNIIEF in 1999.

Research Organization:
Oak Ridge Y-12 Plant (Y-12), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE Office of Defense Programs (DP) (US)
DOE Contract Number:
AC05-00OR22800
OSTI ID:
782895
Report Number(s):
Y/LB-16,072; TRN: US0103527
Resource Relation:
Conference: Institute of Nuclear Materials Management Annual Conference, Indian Wells, CA (US), 07/15/2001--07/19/2001; Other Information: PBD: 29 Jun 2001
Country of Publication:
United States
Language:
English