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Title: High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.120444· OSTI ID:773697

No abstract prepared.

Research Organization:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
Advanced Energy Projects Division, Office of Computational and Technology Research (US)
DOE Contract Number:
AC03-76SF00098
OSTI ID:
773697
Report Number(s):
LBNL-41637; TRN: AH200106%%65
Journal Information:
Applied Physics Letters, Vol. 71, Issue 13; Other Information: PBD: 1 Sep 1997
Country of Publication:
United States
Language:
English

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