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Atomic scale studies of segregation at ceramic/metal heterophase interfaces

Journal Article · · Physical Review Letters
;  [1]
  1. Department of Materials Science and Engineering and the Materials Research Center, Northwestern University, Evanston, Illinois 60208-3108 (United States)

Atom-probe field-ion microscopy was used to measure quantitatively {Gamma}{sub Ag}, the absolute values of the Gibbsian interfacial excess of Ag, at semicoherent MgO/Cu(Ag) {l_brace}222{r_brace} heterophase interfaces. Atomically clean metal oxide/metal heterophase interfaces were obtained by internal oxidation of a pure ternary Cu(Mg,Ag) single-phase alloy to produce octahedral-shaped MgO precipitates, 10 to 30 nm in diameter, in a single-phase Cu(Ag) matrix. The measured value of {Gamma}{sub Ag} at 500 {degree}C is (2{plus_minus}0.6){times}10{sup 15} atoms cm{sup --2}.

DOE Contract Number:
FG02-89ER45403; FG02-89ER45405
OSTI ID:
76560
Journal Information:
Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 2 Vol. 75; ISSN 0031-9007; ISSN PRLTAO
Country of Publication:
United States
Language:
English