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Characterization of the Structure of Y-Ba-Cu-O Coated Conductors

Conference ·
OSTI ID:759252
Transmission electron microscopy (TEM) has been applied to the microstructural investigation of YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} (YBCO) thick films deposited on polycrystalline Ni-based metal substrates by pulsed laser deposition. The films were found to be strongly textured with c-axis oriented grains aligned perpendicular to the substrates. Despite the large average in-plane misorientation, as was estimated from selected area electron diffraction and x-ray diffraction, TEM inspection reveals colonies of submicron-sized grains with low angle tilt grain boundaries. The linkage of the colony structures may provide a continuous percolation pathway for the supercurrent transport in YBCO, which may provide the mechanism for the higher than expected critical current density J{sub c}. Periodic arrays of grain boundary dislocations were observed, which may serve as effective flux pinners.
Research Organization:
Los Alamos National Lab., NM (US)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EE) (US)
DOE Contract Number:
W-7405-ENG-36
OSTI ID:
759252
Report Number(s):
LA-UR-98-4132
Country of Publication:
United States
Language:
English