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Creep in electronic ceramics

Conference ·
OSTI ID:755861
High-temperature creep measurements combined with microstructural investigations can be used to elucidate deformation mechanisms that can be related to the diffusion kinetics and defect chemistry of the minority species. This paper will review the theoretical basis for this correlation and illustrate it with examples from some important electronic ceramics having a perovskite structure. Recent results on BaTiO{sub 3}, (La{sub 1{minus}x}Sr){sub 1{minus}y}MnO{sub 3+{delta}}, YBa{sub 2}Cu{sub 3}O{sub x}, Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub x}, (Bi,Pb){sub 2}Sr{sub 2}Ca{sub 2}Cu{sub 3}O{sub x} and Sr(Fe,Co){sub 1.5}O{sub x} will be presented.
Research Organization:
Argonne National Lab., IL (US)
Sponsoring Organization:
US Department of Energy (US)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
755861
Report Number(s):
ANL/ET/CP-101735
Country of Publication:
United States
Language:
English

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