A simple way of characterizing x-ray downwards-deflecting mirror-bender assemblies using the long trace profiler
Conference
·
OSTI ID:750600
A simple device composed of a modular double-pentaprism system that enables the long trace profiler (LTP) to measure mirrors in nonconventional ways, i.e., in the vertical-downward and sideways positions, has been devised and implemented in the Advanced Photon Source (APS) long trace profiler (LTP II). The systems is very useful in calibrating mirror-bender assemblies. This paper describes the system and gives results of measurements performed with it on a mirror used at the APS.
- Research Organization:
- Argonne National Lab., IL (US)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 750600
- Report Number(s):
- ANL/UPD/CP-100563; TRN: US0003514
- Resource Relation:
- Conference: American Institute of Physics, Stanford, CA (US), 10/13/1999--10/15/1999; Other Information: PBD: 22 Nov 1999
- Country of Publication:
- United States
- Language:
- English
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