Current-phase relations as determinants of superconducting thin-film weak-link I-V characteristics

Journal Article · Sun Aug 01 00:00:00 EDT 1976 · Appl. Phys. Lett.; (United States)

DOI:https://doi.org/10.1063/1.88998· OSTI ID:7358537

Jackel, L D; Henkels, W H; Warlaumont, J M; Buhrman, R A

The dc I-V characteristics of superconducting thin-film Sn-Au proximity bridges and uniform-thickness Sn microbridges have been carefully analyzed as a function of the directly measured current-phase relation (CPR). At sufficiently low dc current and voltage levels where heating and relaxation time effects are not important, the I-V characteristics are very well described by a shunted weak-link model that includes the proper dc CPR and a shunt resistance. (AIP)

• Research Organization: Bell Telephone Laboratories, Holmdel, New Jersey 17733
• OSTI ID: 7358537
• Journal Information: Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 029:3; ISSN APPLA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360104 -- Metals & Alloys-- Physical Properties
420201* -- Engineering-- Cryogenic Equipment & Devices
656100 -- Condensed Matter Physics-- Superconductivity
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CRITICAL CURRENT
CURRENTS
ELECTRIC BRIDGES
ELECTRIC CURRENTS
ELECTRICAL EQUIPMENT
ELECTRICAL PROPERTIES
ELEMENTS
EQUIPMENT
FILMS
GOLD
METALS
PHYSICAL PROPERTIES
SUPERCONDUCTING FILMS
SUPERCONDUCTING JUNCTIONS
THERMODYNAMIC PROPERTIES
TIN
TRANSITION ELEMENTS
TRANSITION TEMPERATURE
TUNNEL EFFECT